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《algan(al)gan量子阱結(jié)構(gòu)的生長與物性研究》由會員上傳分享,免費(fèi)在線閱讀,更多相關(guān)內(nèi)容在學(xué)術(shù)論文-天天文庫。
1、捅斐A1GaN/(A1)GaN多量子阱結(jié)構(gòu)不僅可應(yīng)用于紫外探測器、深紫外發(fā)光二極管,而且可利用量子阱內(nèi)子帶問躍遷制備量子阱紅外探測器。本論文主要從如何提高AIGaN外延薄膜質(zhì)量及A1GaN/GaN多量子阱的生長與物性等方面對AIGaN/(A1)GaN多量子阱結(jié)構(gòu)進(jìn)行了研究,旨在為后期制備出性能優(yōu)異的量子阱紅外探測器打下堅實(shí)的基礎(chǔ)。首先,本論文利用金屬有機(jī)化學(xué)氣相沉積方法在藍(lán)寶石襯底上外延生長了一系列A1GaN薄膜,研究了不同生長因素對A1GaN材料質(zhì)量的影響,發(fā)現(xiàn)提高Al的耦合效率可通過降低反應(yīng)
2、室氣壓、增加上下支路氣流、降低NH3流量有效抑制預(yù)反應(yīng)來實(shí)現(xiàn)。其次本論文分別研究了A1203/A1N/A1GaN及SiC/AlN/AlGaN這兩種體系中A1GaN材料的生長,通過分析其表面形貌初步了解其生長機(jī)理。實(shí)驗(yàn)發(fā)現(xiàn)在A1203/AIN/A1GaN體系中,由于出現(xiàn)反向疇,不同極性A1N的生長速率不一樣,導(dǎo)致具有混合極性的A1N外延層表面比較粗糙。而在SiC襯底上外延生長A1GaN由于不存在反向疇,其晶體質(zhì)量及表面形貌明顯改善,而且發(fā)現(xiàn)通過提高NH3流量可有效減小應(yīng)力,提高A1GaN薄膜的質(zhì)量
3、。最后本論文從物理原理上介紹了A1GaN/GaN量子阱紅外探測器的工作原理及結(jié)構(gòu)設(shè)計,詳細(xì)闡述了六角結(jié)構(gòu)的C面GaN基異質(zhì)結(jié)材料中存在的固有自發(fā)極化和壓電極化效應(yīng)的起源,探索性地在藍(lán)寶石襯底上外延了一系列表面平整、界面陡峭的多量子阱結(jié)構(gòu),研究了不同A1GaN/GaN量子阱寬度對光致發(fā)光光子能量的作用,揭示了極化效應(yīng)和量子限制效應(yīng)對量子阱子帶間躍遷的影響。研究表明在設(shè)計A1GaN/GaN多量子阱結(jié)構(gòu)時,應(yīng)同時考慮極化效應(yīng)及量子限制作用以得到合適的探測波長。關(guān)鍵詞:A1GaN/GaN量子阱;金屬有機(jī)
4、化學(xué)氣相沉積(MOCVD);耦合效率;反向疇;極化效應(yīng);量子限制作用AbstractA1GaN/(AI)GaNmultiplequantumwells(MQWs)structurehasvariousapplications,suchasultraviolet(or)detectors,deepUVlight—emittingdiodes(LED).Duetoitsadvantagesininter-subbandtransition,itcanalsobeusedtofabricateinfr
5、aredphotodetectors(calledquantumwellinfraredphotodetector,QWIP).Inthepresentthesis,AIGaN/(A1)GaNMQWshavebeenprepared如rllighperformanceQWIPandinvestigatedfromtwoaspects,thequalityoftheAIGaNfilmandthegrowthandphysicalpropertiesoftheAIGaN/GaNMQWs.Firstl
6、y,aseriesofAIGaNfilmsweregrownonsapphiresubstratesbyusingmetal—organicchemicalvapordeposition(MOCVD).TheinfluenceofthegrowthparametersonthequalityoftheA1GaNfilmswasinvestigated.Itisfoundthatthecouplingefficiencyofaluminumcanbeenhancedbydecreasingthep
7、ressureofthereactionchamber,increasingtheMOandhydrideflowrate,anddecreasingtheflowrateofNH3torestraintheparasiticalreaction.Secondly,thesurfacemorphologyoftheA1GaNfilmsepitaxiallygrownonA1203/AINandSiC/A1NsystemsWasstudied,thereforethesurfacegrowthme
8、chanismwasinvestigated.ItisrevealedthatdifferentpolarsledtodifferentgrowthratesbecauseofinversiondomainsinA1Ngrownonsapphiresubstrate,SOthecrystalqualityofthefilmsisbad,whichappearsasaroughsurface.However,thecrystalsurfacequalityisgreatlyimprovedwhen