Design Techniques for EMC.pdf

Design Techniques for EMC.pdf

ID:33924361

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頁數(shù):156頁

時間:2019-02-28

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1、DesignTechniquesforEMC–Part1CircuitDesign,andChoiceofComponentsByEurIngKeithArmstrongCEngMIEEMIEEEPartner,CherryCloughConsultants,AssociateofEMC-UKThisisthefirstinaseriesofsixarticlesonbest-practiceEMCtechniquesinelectrical/electronic/mechanicalhardwaredesig

2、n,tobepublishedinthisjournaloverthefollowingyear.Theseriesisintendedforthedesignerofelectronicproducts,frombuildingblockunitssuchaspowersupplies,single-boardcomputers,and“industrialcomponents”suchasmotordrives,throughtostand-aloneornetworkedproductssuchcompu

3、ters,audio/video/TV,instruments,etc.ThesearticleswerefirstpublishedintheEMCJournalasaseriesduring1999.Thisversionincludesanumberofcorrections,modifications,andadditions,manyofwhichhavebeenmadeasaresultofcorrespondencewiththefollowing,towhomIamverygrateful:Fe

4、ngChen,KevinEllis,NeilHelsby,MikeLangrish,TomLiszka,AlanKeenan,TSato,andJohnWoodgate.IamalsoindebtedtoTomSatofortranslatingthesearticlesintoJapaneseandpostingthemonhiswebsite:http://member.nifty.ne.jp/tsato/,aswellassuggestinganumberofimprovements.Thetechniq

5、uescoveredinthesesixarticlesare:1)Circuitdesign(digital,analogue,switch-mode,communications),andchoosingcomponents2)Cablesandconnectors3)Filtersandtransientsuppressors4)Shielding5)PCBlayout(includingtransmissionlines)6)ESD,electromechanicaldevices,andpowerfa

6、ctorcorrectionAtextbookcouldbewrittenaboutanyoneoftheabovetopics(andmanyhave),sothismagazinearticleformatcandonomorethanintroducethevariousissuesandpointtothemostimportantofthebest-practicetechniques.Beforestartingontheabovelistoftopicsitisusefulseetheminthe

7、contextoftheidealEMClifecycleofanewproductdesignanddevelopmentproject.TheprojectEMClifecycleTheEMCissuesinanewprojectlifecyclearesummarisedbelow:?Establishmentofthetargetelectromagneticspecificationsforthenewproduct,including:{Theelectromagneticenvironmentit

8、mustwithstand(includingcontinuous,high-probability,andlow-probabilitydisturbanceevents)andthedegradationinperformancetobeallowedduringdisturbanceevents;{Itspossibleproximitytosensitiveapparatusa

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