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1、氧化鎵籽晶層的制備及其對外延生長氧化鎵薄膜的影響PreparationofGa203seedlayeranditsinfluenceontheepitaxialgrowthofGa203filmsAbstractWiththerapiddevelopmentofoptoelectronicsemiconductortechnology,moreandmorepeoplegetinfavorofthebroadbandgapsemiconductormaterials.Galliumoxide(Ga203)isakindo
2、fbroadbandgapsemiconductormaterialofIII—VIgroups.Thep-Ga203isthemoststabletypeinthesefiveisomers.ThedirectbandgapofGa203iswide(4.2eV-4.9eV),andithasgoodchemicalstabilityandthermalstability,SOithasbroadapplicationprospects,suchasthedeepultraviolettransparentconduc
3、tivefilm,ultravioletdetectors,thinfilmelectroluminescentdevices,gassensor,andfieldeffecttransistor.Inthispaper,Ga203seedlayerwasfabricatedonsapphiresubstrates(A1203)byRFmagnetronsputteringtechnology,andthesapphiresubstratewiththeseedlayerwasannealedtreatment..The
4、nGa203filmswerefabricatedonsapphiresubstrateswithseedlayerandwithoutseedlayerbyMOCVDtechnology.1.Ga203filmswerefabricatedonsapphiresubstratesbylow-pressureMOCVDtechnology.ThecrystalandopticalqualityofGa203thinfilmswasinvestigatedbyX-raydiffractionandopticaltransm
5、ittancespectra.TheGa203filmisamorphousthatgrowndirectlyonthesapphiresubstrateandthetransmittanceandtheopticalbandgapwidthoftheGa203filmsareverysmall.Theexperimentshowsthat,thecrystalqualityandtheopticalpropertiesoftheGa203filmsarenotidealwhentheGa203filmswerefabr
6、icateddirectlyonsapphiresubstratesbyusinglow—pressureMOCVDtechnology.2.Inordertosolvetheaboveproblem,Ga203seedlayerwasfabricatedonthesapphiresubstratebyRFmagnetronsputtering,thenthe13-Ga203filmswerefabricatedonsapphiresubstrateswiththeseedlayerbylow-pressureMOCVD
7、technology.Theexperimentshowsthat,RelativetotheGa203filmsfabricateddirectlyonsapphiresubstrates,thecrystalqualityandtheopticalpropertiesoftheGa203filmsfabricatedonsapphiresubstrateswithGa203seedlayerhaveimproved,butnotevidently.3.TheGa203seedlayerwasannealedatahi
8、ghtemperature,thenthep-Ga203filmswerefabricatedonsapphiresubstrateswiththeannealedseedlayerbylow-pressureMOCVDtechnology.TheXRDshowsthat,theGa203filmshavetheob