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1、IEEETRANSACTIONSONCOMPUTERS,VOL.45,NO.6,JUNE1996763MultipleFaultDetectioninFan-OutFreerith.misthatitconsistsoftwophases.SincethetimecomplexityisO(N2),itwillincreasethetestingcostandexecutiontimesignifi-CircuitsUsingMinimalSingleFaultTestSetcantlyforlarg
2、ecircuits.Inthispaper,anewmethodcalledOPTG(OnePhaseTestK.LaiandP.K.LalaGeneration)isdevelopedtogenerateaminimaltestsettodetectsinglestuck-atfaultandfullcoverageofmultiplestuck-atfaultsinAbstract-Thispaperpresentsanewalgorithmtogeneratetestsetsafan-out-f
3、reecombinationalcircuit.Itisbasedontheconceptofforsinglestuck-atfaults,whichalsodetectallmultiplestuck-atfaultsin’outputcount’developedin[61.TheoutputcountofalineLinafan-out-freecircuits.Thisalgorithmderivesthetestsetforeachnodeincircuitisrepresentedas[
4、X,Y],whereXandYareintegervaluesafan-out-freecircuitbycalculatingtheoutputcountofthenode.Theoutputcountindicatesthenumberoftestpatternsneededtocheckfor[61.XandYrepresenttheminimumnumberofinputpatternsallfaultsinthecorrespondingsubcircuit.Thefan-out-freec
5、ircuitcanbeneededtotestforstuck-at-0andstuck-at-1fault,respectively,atanycombinationofAND,OR,NOT,NAND,andNORgates.theoutputofthegatedrivinglineL.IfLisaprimaryinputline,theoutputcountis[l,11since,inordertotestwhetherthelineisIndexTerms-Multiplefaults,fan
6、-out-freecircuit,outputcount,testgeneration.stuck-at-0(stuck-at-1)itmustbedriventologic1(logic0).Inotherwords,asinglelogic0(i.e.,X=l),andasinglelogic1(i.e.,Y=1)+constitutetheoutputcountvalueforaprimaryinputline.Theoutputcountatacircuitnodedeterminesthen
7、umberof1INTRODUCTIONtestpatternsneededtotestthecorrespondingsubcircuit.Theele-mentsinthiscircuitcanbeAND,OR,NOT,NOK,orNANDgate.FAULTinlogiccircuitsareingeneralassumedtobeofonlysingleForinstance,iftheoutputcountis[3,71atanode,thisimpliesthestuck-atnature
8、.However,inVLSIdevicesalocaldefectmaycre-minimaltestsetforthistestingnodetodetectallsingleandmulti-atemultipleinsteadofsinglestuck-atfaults.AcircuitwithNsig-plestuck-atfaultsislo(=3+7).Threeofthesepatternsproducenallinescanhave3N
