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1、SEMIG60-94N/A?SEMI1994,1996TESTMETHODFORTHEMEASUREMENTOFELECTROSTATICPROPERTIESOFSEMICONDUCTORLEADFRAMEINTERLEAFINGMATERIALS1Purpose4Terminology1.1Thistestmethoddescribesaproceduretodeter-4.1interleaf(forsemiconductorleadframes)?Aminetheelectrostaticpropertiesofinterleafmateri
2、alspaperorplasticfilmplacedbetweenlayersofsemicon-inTlmorsheetformbymeasuringthemagnitudeandductorleadframestripstopreventtransformation.polarityofaninducedchargeandthetimerequiredfor4.2electrostaticproperties?Forthepurposesofcompletedissipationofthecharge.thisdocument,electro
3、staticpropertiesaredefinedasNote1:Themethodisindependentofvolumeorinsu-theabilityofamaterial,whengrounded,todissipatealationresistivities.chargeinducedontothesurfaceofthatmaterial.2Scope5SummaryofMethod2.1Thistestmethodissuitableforallinterleafmate-Themethodinvolveschargingthe
4、interleafmaterialtorialsandmaybeusedbyvendorsatoutgoinginspec-ahighvoltageandobservingthetimerequiredforthetion,orcustomersatincominginspection.chargetobedissipatedusinganelectrometer.3ApplicableDocuments6SigniTcance3.1RelatedDocuments?Thefollowingdocuments6.1Thisprocedureeval
5、uatestheelectrostaticbuildprovideadditionalinformationfortestingelectrostaticupanddissipationpropertiesoftheinterleafmaterialsproperties.ThetestmethoddescribedinthisdocumentwhichmayaffectthereliabilityandefTciencyofisbasedonFED-STD-101C.devices.3.1.1ElectronicIndustriesAssocia
6、tion17InterferencesEIA-541?PackagingMaterialsStandardsforESD7.1TheinterleafmaterialandtheleadframesmustSensitiveItemsonlybetouchedwhilewearingdouble-layergloves2.1.2FederalSpeciTcations2withpolyethyleneouterglovesinordertoavoidcon-taminationwhichmaychangetheelectrostaticproper
7、-FED-STD-101C?TestProceduresforPackagingties.Items37.2ThetestisnotvalidiftheinterleaTngmaterialis2.1.3JISSpeciTcationsdusty.JISK6911?TestingMethodsforThermosettingPlas-tics8EquipmentJISL1094?TestingMethodsforElectrostaticPro-8.1Aluminumpanelmeasuring127mm′76.2mm′pensityofWoven
8、andKnittedFabrics3.2mm(5"′3"′1/8").8.2Highvoltagesource,0to15
