資源描述：
《滅弧室電場分析》由會員上傳分享，免費在線閱讀，更多相關(guān)內(nèi)容在工程資料-天天文庫。
1、LowfrequencysimulationofaGasInsulatedSwitchgearCSTEMSTUDIO?(CSTEMS)canbeappliedtothesimulationofanABBCalorEmagSF6GasInsulatedSwitchgear(GlS)suchastheonedepictedinfigure1whichwasalsosimulatedin[1].Aprimarygoalofsuchasimulationistoobtainthecurrentdistrib
2、utionintheswitchgearconductorswithproximityandskindeptheffectstakenintoaccount.TheCSTEMSLowFrequencysolverisappropriateforthispurpose?ThegeometryisimportedfromPro/E?andconsistsofametallichousinginwhichathree-phaseconductorsystemissituated.Themetallicho
3、usingisconsideredasperfectlyconductingwhereastheinnerconductorshaveaelectricalconductivityof3.2e7S/m?50Hzthreephasecurrentsofmagnitude4000A,shiftedinphaseby120degrees,areinjectedvia3so-calledcurrentpaths,definedattheendsoftheconductorsonthesamesideofth
4、eGlS?Figure1:Gasinsulatedswitchgearwithhousing,conductorsandcurrentpathexcitationarrangementTheskindepthmustbetakenintoaccountwhenmeshingthemodelhencealargenumberofmeshcellsarerequired.Thismodel,solvedwiththeCSTEMSLowFrequency(magnetoquasistatic)tetrah
5、edralsolver,consistsof1.48milliontetrahedronscorrespondingto1.72millioncomplexunknownsandsimulatestoanaccuracyof1e-6injust8minutesonanIntel2GHzWoodcrestsystem.Figure2:TetrahedralmeshusedforthesimulationofthegasinsulatedswitchgearThegeneratedmeshandthec
6、urrentpathexcitationsforthesimulationareshowninfigure2.Theconductorshavebeenadequatelydiscretisedtoallowforthecorrectmodellingoftheskindepthbyspecifyingamaximummeshstepwidth?CSTZ.54e6乙32巳62.10e61.8?e6
7、1-65e61.43e61?Z6e69.78e5??5佔5.31e53-0?e5j0」Figure3:
8、PhasevariationofcurrentdistributionintheconductorsFurtherpost-processingquantitiessuchastheelectricallossesandforcesontheconductorsmayalsobecalculated.ThisarticlehasdemonstratedsomeofthepowerfulcapabilitiesofCSTEMSforthesimulationofamediumvoltageswitch
9、gearcomporient,namely,thecomprehensiveCADImportfeaturesandthefastandefficientlowfrequencysolver?Referenee:[1]OliverStezAndreasHauser,GabrielWittum,"'AdaptiveLocalMultigridMethodsforSolvingTime?HarmonicEddCurrentProblems”,IEEETransaction
